Article,
AI safety of film capacitors
Contributors
Zhang, Yong-Xin
0000-0002-9243-2673
[1]
Chen, Fang-Yi
0000-0001-5953-7214
[2]
Wang, Jian-Xiao
0000-0001-9871-5263
[3]
Feng, Qi-Kun
0000-0003-0337-2064
[1]
Zhao, Hong-Bo
0000-0002-0043-0030
[5]
Dang, Zhi-Min
0000-0001-5961-9033
(Corresponding author)
[1]
Affiliations
- [1] Tsinghua University [NORA names: China; Asia, East];
- [2] Carnegie Mellon University [NORA names: United States; America, North; OECD];
- [3] Peking University [NORA names: China; Asia, East];
- [4] Harvard University [NORA names: United States; America, North; OECD];
- [5] Aalborg University [NORA names: AAU Aalborg University; University; Denmark; Europe, EU; Nordic; OECD];
(... more)
Abstract
Abstract With a large number of film capacitors being deployed in critical locations in electrical and electronic systems, artificial intelligence (AI) technology is also expected to address the problems encountered in this process. According to our findings, AI applications can cover the entire lifecycle of film capacitors. However, the AI safety hazards in these applications have not received the attention they deserve. To meet this, the authors argue, with specific examples, risks that flawed, erratic, and unethical AI can introduce in the design, operation, and evaluation of film capacitors. Human‐AI common impact and more multi‐dimensional evaluation for AI are proposed to better cope with unknown, ambiguity, and known risks brought from AI in film capacitors now and in the future.
