LIGHT-FIELD IMAGING BASED ON TILT-ABERRATION
Applicants:
- Technical University of Denmark [NORA names: DTU Technical University of Denmark; University; Denmark; Europe, EU; Nordic; OECD]
Abstract
Disclosed is a method for obtaining a transverse phase gradient of a wave field from at least a first and a second wavefield intensity map comprising the steps of; capturing at a first incoherent tilt aberration said first wave field intensity map of a target at a first degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing said first wave field intensity map; capturing at a second and different incoherent tilt aberration said second wave field intensity map of said target at a second degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing said second wave field intensity map; determining said transverse phase gradient on the basis of at least a difference of logarithms of wavefield intensity maps divided by the magnitude of the difference between said first incoherent tilt aberration and said second incoherent tilt aberration. An imaging system, a computer program product and a use of the method is further disclosed.
Patent Family Records (1)
LIGHT-FIELD IMAGING BASED ON TILT-ABERRATION
Technical University of Denmark, UNIV DANMARKS TEKNISKE Simons, Hugh, Beltran, Mario Alejandro
2023, WO-2023165667-A1